Antiferromagnetic structure of exchange-coupled thin films studied using angle-dependent x-ray absorption spectroscopy

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DOE, Basic Energy Sciences
Jia, Y., Chopdekar, R. V., Shafer, P., Arenholz, E., Liu, Z., Biegalski, M. D., & Takamura, Y. (2017). Antiferromagnetic structure of exchange-coupled thin films studied using angle-dependent x-ray absorption spectroscopy . Physical Review B, 96(21). doi:10.1103/PhysRevB.96.214411 - Report Number: ALS-1007960
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Title Antiferromagnetic structure of exchange-coupled thin films studied using angle-dependent x-ray absorption spectroscopy
AuthorsY. Jia, R. Chopdekar, P. Shafer, E. Arenholz, Z. Liu, M. Biegalski, Y. Takamura
JournalPhysical Review B
Date2017-12-08
Volume96
Issue21
ISSN2469-9950

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